Structural study of very thin anodic alumina films on silicon by anodization in citric acid aqueous solution

Journal of Nanoscience and Nanotechnology

Volumn 5, Issue 3, 2005, Pages 454-458

  Kokonou, M ^a   Nassiopoulou, A G ^a   Giannakopoulos, K P ^b   Boukos, N ^b   Travlos, A ^b  

^a INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

^b INSTITUTE OF MATERIALS SCIENCE   (Greece)

Author keywords

Alumina films on Si; Anodization in citric acid; Structural characterization (TEM, EELS)

Indexed keywords

ALUMINA FILMS ON SI; ANODIZATION IN CITRIC ACID; STRUCTURAL CHARACTERIZATION (TEM, EELS);

ALUMINUM ALLOYS; AMORPHOUS ALLOYS; ANODIC OXIDATION; DENSITY (SPECIFIC GRAVITY); SILICON; TRANSMISSION ELECTRON MICROSCOPY;

THIN FILMS;

ALUMINUM OXIDE; BIOMATERIAL; CITRIC ACID; NANOMATERIAL;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CRYSTALLIZATION; ELECTRODE; ELECTROPLATING INDUSTRY; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; POROSITY; SOLUTION AND SOLUBILITY; SURFACE PROPERTY;

ALUMINUM OXIDE; CITRIC ACID; COATED MATERIALS, BIOCOMPATIBLE; CRYSTALLIZATION; ELECTRODES; ELECTROPLATING; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; NANOSTRUCTURES; NANOTECHNOLOGY; POROSITY; SOLUTIONS; SURFACE PROPERTIES;

EID: 22844436760     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2005.064     Document Type: Article

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