Structural information from ion mobility measurements: Applications to semiconductor clusters

Chemical Society Reviews

Volumn 29, Issue 4, 2000, Pages 26-35

  Shvartsburg, Alexandre A ^a,c   Hudgins, Robert R ^a,d   Dugourd, Philippe ^b   Jarrold, Martin F ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b UNIVERSITÉ LYON 1   (France)

^c YORK UNIVERSITY   (Canada)

^d UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22644436841     PISSN: 03060012     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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2. For a recent review of gas phase biomolecule studies, see, C. S. Hoasland-Hyzer, A. E. Counterman and D. E. Clemmer, Chem. Rev., 1999, 99, 3037.
3. E. A. Mason and E. W. McDaniel, Transport Properties of Ions in Gases, Wiley, New York, 1988.
4. For a recent review of the analytical applications of ion mobility measurements, see, J. I. Baumbach and G. A. Eiceman, Appl. Spectrosc., 1999, 53, 338A.
5. T. M. Sanders and S. R. Forest, J. Appl. Phys., 1989, 66, 3317.
6. T. W. Carr, J. Chromatogr. Sci., 1977, 15, 85.
7. G. von Helden, M. T.Hsu, P. R. Kemper and M. T. Bowers, J. Chem. Phys., 1991, 95, 3835.
8. See, for example, P. Dugourd, R. R. Hudgins, J. M. Tenenbaum and M. F. Jarrold, Phys. Rev. Lett., 1998, 80, 4197.
9. For a review of the fullerene formation mechanisms, see, N. S. Goroff, Ace. Chem. Res., 1996, 29, 77.
10. For an overview of the other cluster studies, see, D. E. Clemmer and M. F. Jarrold, J. Mass Spectrom., 1997, 32, 577.
11. See, for example, M. F. Jarrold and J. E. Bower, J. Chem. Phys., 1992, 96, 9180.
12. Ph. Dugourd, R. R. Hudsins, D. E. Clemmer and M. F. Jarrold, Rev. Sci. Iustrum., 1997, 68, 1122.
13. C. Wu, W. F. Siems, G. R. Asbury and H. H. Hill, Anal. Chem., 1998, 70, 4929.