Improvement in detection limits by using helium ions for particle-induced x-ray emission

X-Ray Spectrometry

Volumn 34, Issue 4, 2005, Pages 393-399

  Beck, Lucile ^a  

^a Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEUTERIUM; ELECTROMAGNETIC WAVE EMISSION; HELIUM; IONS; TRACE ELEMENTS; X RAY SCATTERING;

DETECTION LIMITS; HELIUM 4; HELIUM ION; HIGH-IONIZATION; LARGE PENETRATIONS; MATRIX ELEMENTS; PARTICLE INDUCED X-RAY EMISSION; PIXE ANALYSIS; POWER; SECONDARY ELECTRONS;

ION BEAMS;

EID: 22544483538     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.854     Document Type: Conference Paper

References (36)

1. Johansson SAE, Campbell JL. PIXE: a Novel Technique for Elemental Analysis. Wiley: Chichester, 1988.
2. Johansson SAE, Campbell JL, Malmqvist KG. Particle-induced X-ray Emission Spectrometry (PIXE). Wiley: Chichester, 1995.
3. Moretto Ph, Beck L. Les Techniques de l'Ingénieur. 2003-2004; P 2557-P 2558.
4. Johansson TB, Akselson R, Johansson SAE. Nucl. Instrum. Methods B 1970; 84: 141.
5. Johansson SAE, Johansson TB. Nucl. Instrum. Methods B 1976; 137: 473.
6. Mitchell IV, Barfoot KM. Nucl. Sci. Appl. 1981; B1: 101.
7. Barfoot KM. Nucl. Instrum. Methods B 1989; 43: 218.
8. Chêne J, Trocellier P. J. Non-Cryst. Solids 2004; 337: 86.
9. Duerden P, Cohen DD, Dragovich D, Clayton E. Nucl. Instrum. Methods B 1986; 15: 643.
10. Johansson SAE. Int. J. PIXE 1992; 2: 33.
11. Peisach M, Pineda CA, Pillay AE. Nucl. Instrum. Methods B 1994; 85: 100.
12. Amsel G. Vide Sci. Tech Appl. in press.
13. Trocellier P, Trouslard Ph. Les Techniques de l'Ingénieur 2002; P 2560-P 2562.
14. Chu WK, Mayer JW, Nicolet MA. Backscattering Spectrometry. Academic Press: New York, 1978.
15. Terwagne G. Nucl. Instrum. Methods B 1997; 122: 1.
16. Laik B, Gessier F, Mercier F, Trocellier P, Chausse A, Messina R. Electrochim. Acta 1999; 44: 1667.
17. Grime GW. Nucl. Instrum. Methods B 1996; 109/110: 170.
18. Flocchini RG, Feeney PJ, Sommerville RJ, Cahill TA. Nucl. Instrum. Methods 1972; 100: 397.
19. Folkmann F. J. Phys. E 1975; 8: 429.
20. Romo-Kröger CM. Nucl. Instrum. Methods B 1990; 49: 29.
21. Haddi A, Etcheverry MP, Trocellier P. Nucl. Instrum. Methods B; article accepted.
22. Cohen DD, Harrigan M. At. Data Nucl. Data Tables 1985; 33: 255.
23. Brandt W, Lapicki G. Phys. Rev. A 1981; 23: 173.
24. Folkmann F, Gaarde C, Huus T, Kemp K. Nucl. Instrum. Methods 1974; 116: 487.
25. Ishii K, Morita S. Int. J. PIXE 1989; 1: 1.
26. Campbell JL. Nucl. Instrum. Methods B 1990; 49: 115.
27. Campbell JL. Nucl. Instrum. Methods B 1996; 109/110: 71.
28. Lépy MC, Campbell JL, Laborie JM, Plagnard J, Stemmler P. Nucl. Instrum. Methods A 2000; 439: 239.
29. Papp T, Campbell JL. X-Ray Spectrom. 2001; 30: 77.
30. Campbell JL, Cauchon G, Lépy MC, Mc Donald L, Plagnard J, Stemmler P, Teesdale WJ, White G. Nucl. Instrum. Methods A 1998; 418: 394.
31. Beck L, Bassinot F, Gehlen M, Trouslard Ph, Pellegrino S, Levi C. Nucl. Instrum. Methods B 2002; 190: 482.
32. Beck L, de Château-Thierry A, Frontier JP, Trouslard Ph, Pellegrino S. Nucl. Instrum. Methods B 2004; 219/220: 394.
33. Maxwell JA, Campbell JL, Teesdale WJ. Nucl. Instrum. Methods B 1989; 43: 218.
34. Hopman L, Nejedly Z, Maxwell JA, Campbell JL. Nucl. Instrum. Methods B 2002; 189: 138.
35. Sera K, Futatsugawa S. Int. J. PIXE 1996; 6: 71.
36. Harrisonn JF, Elred RA. Adv. X-Ray Anal. 1977; 48: 1718.