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Volumn 30, Issue 2, 2001, Pages 77-82
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Size and origin of the escape peak in various Si(Li) detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
LINES SHAPES;
LOWER ENERGIES;
NONLINEAR FITTING;
PEAK INTENSITY RATIO;
PEAK RATIOS;
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EID: 0035590172
PISSN: 00498246
EISSN: None
Source Type: Journal
DOI: 10.1002/xrs.459 Document Type: Article |
Times cited : (20)
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References (26)
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