SCOPUS 정보 검색 플랫폼

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 3, 2005, Pages 1479-1482

Raman scattering studies on polycrystalline Cd0.9Zn 0.1Te thin films

(5) Sridharan, M G a Mekaladevi, M a Narayandass, Sa K a Mangalaraj, D a Lee, H Chul b

a BHARATHIAR UNIVERSITY (India)

b Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

Author keywords

AFM; Cd0.9zn0.1Te films; Raman scattering; Vacuum evaporation; XRD

Indexed keywords

CADMIUM ALLOYS; CADMIUM METALLOGRAPHY; CRYSTALLINITY; RAMAN SCATTERING; SEMICONDUCTOR ALLOYS; SUBSTRATES; VACUUM EVAPORATION; X RAY DIFFRACTION; ZINC ALLOYS; ZINC METALLOGRAPHY; ZINC SULFIDE;

AS-DEPOSITED FILMS; CD0.9ZN0.1TE; CLEANED GLASS SUBSTRATES; LONGITUDINAL OPTICS; SUBSTRATE TEMPERATURE; TRANSVERSE OPTICS; X-RAY DIFFRACTION STUDIES; ZINC-BLENDE STRUCTURES;

THIN FILMS;

EID: 22544482647 PISSN: 14544164 EISSN: None Source Type: Journal
DOI: None Document Type: Conference Paper

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.