Scanning electron microscopy imaging of microcracks and charging phenomena on a laser-damaged CaF2 surface

Scanning

Volumn 19, Issue 6, 1997, Pages 416-425

  Johansen, H ^a   Erfurth, W ^a   Gogoll, S ^b   Stenzel, E ^b   Reichling, M ^b   Matthias, E ^b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Charging phenomena; Laser induced microcracks; Lateral size effect; Scanning electron microscopy imaging of CaF2

Indexed keywords

ARTICLE; IMAGING; LASER; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 0031400035     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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