Microstructural Characterization of GaN on (0001) Sapphire

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 628-629

  Mao, Zhigang ^a   Johnson, Matthew T ^a   Barry Carter, C ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444453830     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600023266     Document Type: Conference Paper

References (2)

1. S. Strite and H. Morkoc.J. Vac. Sci. Technol, B10(1992)1237
2. M. T. Johnson, Z. Mao, and C. B. Carter. Mat. Res. Soc. Symp. Proc, 482(1997), in press