Crystal defects in GaN on (0001) sapphire

Materials Research Society Symposium - Proceedings

Volumn 482, Issue , 1997, Pages 405-409

  Johnson, Matthew T ^a   Mao, Zhigang ^a   Carter, C Barry ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); NITRIDES; SAPPHIRE; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

BURGERS VECTORS; DARK FIELD IMAGING; SEMICONDUCTING GALLIUM NITRIDES; WEAK BEAM MICROSCOPY;

SEMICONDUCTING FILMS;

EID: 0031379393     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-482-405     Document Type: Conference Paper

References (13)