Planar lightwave circuit six-port technique for optical measurements and characterizations

Journal of Lightwave Technology

Volumn 23, Issue 6, 2005, Pages 2148-2157

  Molina Fernandez I ^a,b   Wangüemert Përez, J Gonzalo ^b   Ortega Monux A ^b   Bosisio, Renato G ^a   Wu, Ke ^a  

^a POLY GRAMES RESEARCH CENTER   (Canada)

^b UNIVERSITY OF MÁLAGA   (Spain)

Author keywords

Measurement; Optical interferometry; Planar lightwave circuit (PLC); Six port reflectometer

Indexed keywords

FREQUENCIES; INTERFEROMETRY; LIGHT INTERFERENCE; MULTIMODE FIBERS; OPTICAL FIBER COUPLING; OPTICAL VARIABLES MEASUREMENT; REFLECTION; REFLECTOMETERS;

MULTIMODE INTERFERENCE COUPLERS; PLANAR LIGHTWAVE CIRCUIT (PLC); SIX PORT REFLECTOMETER;

INTEGRATED OPTOELECTRONICS;

EID: 22444445001     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2005.849944     Document Type: Article

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