Reflection characteristics and cascadability of a multi-mode interference 3 dB coupler

IEE Proceedings: Optoelectronics

Volumn 149, Issue 5-6, 2002, Pages 217-221

  Shibata, Y ^a   Oku, S ^a   Yamamoto, M ^a   Naganuma, M ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTED FEEDBACK LASERS; ETCHING; HETEROJUNCTIONS; INTERFACES (MATERIALS); LIGHT INTERFERENCE; LIGHT REFLECTION; REFLECTOMETERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES;

CROSS SECTIONAL SCANNING ELECTRON MICROSCOPY; INTERFEROMETRIC REFLECTOMETER; MODE-FILTERING EFFECT; MULTI-MODE INTERFERENCE; REACTIVE BEAM ETCHING;

WAVEGUIDE COUPLERS;

EID: 0036823251     PISSN: 13502433     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-opt:20020497     Document Type: Article

References (13)

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