Vector near-field calculation of scanning near-field optical microscopy probes using Borgnis potentials as auxiliary functions

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 22, Issue 7, 2005, Pages 1263-1273

  Wang, Xueen ^a,b   Fan, Zhaozhong ^a   Tang, Tiantong ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b XIDIAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; COMPUTATIONAL METHODS; INTEGRAL EQUATIONS; PROBES; VECTORS;

BORGNIS POTENTIALS; BOUNDARY INTEGRAL EQUATION METHOD;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; EQUIPMENT; EVALUATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; SCANNING PROBE MICROSCOPY; THREE DIMENSIONAL IMAGING; TRANSDUCER;

ALGORITHMS; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, SCANNING PROBE; TRANSDUCERS;

EID: 22244434222     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.22.001263     Document Type: Article

References (18)

1. D. W. Pohl, W. Denk, and M. Lanz, "Optical stethosocopy: image recording with resolution λ/20," Appl. Phys. Lett. 44, 651-655 (1984).
2. R. C. Reddick, R. J. Warmack, and T. L. Ferrell, "New form of scanning optical microscopy," Phys. Rev. B 39, 767-770 (1989).
3. D. Courjon, K. Sarageddine, and M. Spazer, "Scanning tunneling optical microscopy," Opt. Commun. 71, 23-28 (1989).
4. E. Betzig, P. L. Finn, and J. S. Weiner, "Combined shearforce and near-field scanning optical microscopy," Appl. Phys. Lett. 60, 2484-2486 (1992).
5. S. Bozhevolnyi, S. Berntsen, and E. Bozherolnaya, "Extension of the macroscopic model for reflection near-field microscopy: regularization and image formation," J. Opt. Soc. Am. A 11, 609-617 (1994).
6. B. Labani, C. Girard, D. Courjon, and D. Van Labeke, "Optical interaction between a dielectric tip and a nanometric lattice: implications for near-field microscopy," J. Opt. Soc. Am. B 7, 936-943 (1990).
7. M. Xiao and X. Conn, "Shear-force, constant-height, and constant-intensity imaging in scanning near field optical microscopy with s- and p-polarized incident light," Opt. Eng. (Bellingham) 39, 2495-2500 (2000).
8. D. A. Christensen, "Analysis of near field tip patterns including object interaction using finite-difference time-domain calculations," Ultramicroscopy 57, 189-195 (1995).
9. F. I. Baida, D. Van Labeke, and Y. Pagani, "Body-of-revolution FDTD simulations of improved tip performance for scanning near-field optical microscopes," Opt. Commun. 225, 241-252 (2003).
10. R. Carminati and J. J. Greffet, "Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surface," J. Opt. Soc. Am. A 12, 2716-2725 (1995).
11. P. J. Valle, J. J. Greffet, and R. Carminati, "Optical contrast, topographic contrast and artifacts in illumination-mode scanning near-field optical microscopy," J. Appl. Phys. 86, 648-656 (1999).
12. L. Novotny, D. W. Pohl, and B. Hecht, "Scanning near-field optical probe with ultrasmall spot size," Opt. Lett. 20, 970-972 (1995).
13. S. Bozhevolnyi, "Topographical artifacts and optical resolution in near-field optical microscopy," J. Opt. Soc. Am. A 14, 2254-2259 (1997).
14. M. Tanaka and K. Tanaka, "Boundary integral equations for computer-aided design and simulations of near-field optics: two-dimensional optical manipulator," J. Opt. Soc. Am. A 15, 101-108 (1998).
15. X. E. Wang, Z. Z. Fan, and T. T. Tang, "Study on the power transmission and light spot size of optical probes in scanning near-field optical microscopes," Opt. Commun. 235, 31-40 (2004).
16. A. Vainstein, Electromagnetic Waves (Soviet Radio Press, Moscow, 1957) (in Russian).
17. Keqian Zhang and Dejie Li, Electromagnetic Theory for Microwaves and Optoelectronics (Springer-Verlag, Berlin, 1998).
18. R. Petit, Electromagnetic Theory of Gratings (Springer-Verlag, Berlin, 1980).