Quantitative evaluation of the single-flux-quantum cross/bar switch

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART I, 2005, Pages 324-327

  Yamada, T ^a   Yoshida, M ^a   Hanai, T ^a   Fujimaki, A ^a   Hayakawa, H ^a   Kameda, Y ^b   Yorozu, S ^b   Terai, H ^c   Yoshikawa, N ^d  

^a NAGOYA UNIVERSITY   (Japan)

^b SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^c NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

^d YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

Logic simulation; On chip test system; Router; Semiconductor; SFQ; Switch

Indexed keywords

COMPUTER SIMULATION; CROSSBAR EQUIPMENT; EMITTER COUPLED LOGIC CIRCUITS; ENERGY UTILIZATION; JITTER; JOSEPHSON JUNCTION DEVICES; LSI CIRCUITS; MAGNETIC FIELDS; MULTIPLEXING; SEMICONDUCTOR MATERIALS; WAVELENGTH DIVISION MULTIPLEXING;

LOGIC SIMULATION; ON-CHIP TEST SYSTEM; ROUTER SEMICONDUCTORS; SINGLE-FLUX-QUANTUM (SFQ);

SEMICONDUCTOR SWITCHES;

EID: 22144465485     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.849819     Document Type: Conference Paper

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