|
Volumn 7, Issue 2 PART 3, 1997, Pages 3438-3441
|
Advanced on-chip test technology for RSFQ circuits
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
BANDWIDTH;
DIGITAL CIRCUITS;
ELECTRIC GENERATORS;
JOSEPHSON TRANSMISSION LINES;
RAPID SINGLE FLUX QUANTUM (RSFQ) CIRCUITS;
SUPERCONDUCTING ELECTRIC LINES;
|
EID: 0031163495
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/77.622124 Document Type: Article |
Times cited : (45)
|
References (8)
|