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Volumn 86, Issue 26, 2005, Pages 1-3
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Crystallization of amorphous In 2O 3-10 wt % ZnO thin films annealed in air
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS INDIUM ZINC OXIDE (A-IZO);
DC MAGNETRON SPUTTERING;
FREE ELECTRON DENSITY;
OXYGEN-VACANCY-LIKE DEFECTS;
AIR;
AMORPHOUS MATERIALS;
ANNEALING;
BOROSILICATE GLASS;
CARRIER CONCENTRATION;
CRYSTALLIZATION;
FLAT PANEL DISPLAYS;
INDIUM COMPOUNDS;
MAGNETRON SPUTTERING;
MICROSTRUCTURE;
PHASE DIAGRAMS;
STOICHIOMETRY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
THIN FILMS;
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EID: 22144460183
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1977209 Document Type: Article |
Times cited : (75)
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References (7)
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