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Current Applied Physics

Volumn 5, Issue 6, 2005, Pages 615-618

Mobility of electrons and holes in an n-type organic semiconductor perylene diimide thin film

(6) Kim, Jung Yong a Chung, In Jae a Lee, Changhee b Kim, Young Chul c Kim, Jai Kyeong d Yu, Jae Woong d

a Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

b Seoul National University (South Korea)

c Kyung Hee University (South Korea)

d Korea Institute of Science and Technology (South Korea)

Author keywords

Mobility; N type semiconductor; Perylene diimide; Time of flight

Indexed keywords

ABSORPTION SPECTROSCOPY; CYCLIC VOLTAMMETRY; ELECTRIC FIELDS; ELECTRON MOBILITY; HOLE MOBILITY; OPTICAL MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

N-TYPE SEMICONDUCTOR; PERYLENE DIIMIDE; TIME OF FLIGHT;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 22144435595 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2004.08.007 Document Type: Article

Times cited : (14)

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