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Volumn 22, Issue 7, 2005, Pages 1757-1760

Investigation of laser-induced damage on multi-layer dielectric gratings

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; MANUFACTURE; OXIDE FILMS;

EID: 22044453789     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/22/7/054     Document Type: Article
Times cited : (13)

References (11)
  • 10
    • 22044448856 scopus 로고
    • ISO 1995 Lasers and Laser-Related Equipment: Determination of Laser-Induced Damage Threshold of Optical Surfaces (one-on-one test) (Din Aubenstelle, Germany) part 1 11254-2 http://www.iso.org/iso/en/ CatalogueDetailPage
    • (1995)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.