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Volumn 5707, Issue , 2005, Pages 302-308

10 W peak power from a gain-switched picosecond all-semiconductor laser

Author keywords

Frequency conversion; Microscopy; MOPA; Nonlinear optics; Picosecond diode laser; Tapered amplifier

Indexed keywords

FLUORESCENCE; GAIN MEASUREMENT; LASER PULSES; LASER THEORY; LIGHT EMISSION; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; NONLINEAR OPTICS; OPTICAL FREQUENCY CONVERSION; POWER AMPLIFIERS; SECOND HARMONIC GENERATION; TISSUE;

EID: 21844479552     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.591479     Document Type: Conference Paper
Times cited : (11)

References (6)
  • 1
    • 0242322565 scopus 로고    scopus 로고
    • Toward fluorescence nanoscopy
    • S.W. Hell, 'Toward fluorescence nanoscopy", Nature Biotechnol. 21(11): p. 1347-1355 (2003)
    • (2003) Nature Biotechnol. , vol.21 , Issue.11 , pp. 1347-1355
    • Hell, S.W.1
  • 2
    • 0000295573 scopus 로고    scopus 로고
    • Increasing the resolution of far-field fluorescence light microscopy by point-spread-function engineering
    • (ed. J.R. Lakowicz), (Plenum, New York)
    • S.W. Hell, and M. Kroug, "Increasing the resolution of far-field fluorescence light microscopy by point-spread-function engineering" in Topics in Fluorescence Spectroscopy, Vol 5. (ed. J.R. Lakowicz), p 361-422 (Plenum, New York, 1997).
    • (1997) Topics in Fluorescence Spectroscopy , vol.5 , pp. 361-422
    • Hell, S.W.1    Kroug, M.2
  • 3
    • 0036674522 scopus 로고    scopus 로고
    • Saturated patterned excitation microscopy - A concept for optical resolution improvement
    • R.Heintzmann, T.M. Jovin, and C. Cremer, "Saturated patterned excitation microscopy - a concept for optical resolution improvement. J. Opt. Soc. Am. A, Vol 19, p1599-1609 (2002)
    • (2002) J. Opt. Soc. Am. A , vol.19 , pp. 1599-1609
    • Heintzmann, R.1    Jovin, T.M.2    Cremer, C.3
  • 4
    • 0028460042 scopus 로고
    • Breaking the diffraction resolution limit by stimulated emission: Stimulated emission depletion microscopy
    • S.W. Hell, J. Wichmann, "Breaking the diffraction resolution limit by stimulated emission: stimulated emission depletion microscopy." Opt. Lett. 19, 780-782 (1994)
    • (1994) Opt. Lett. , vol.19 , pp. 780-782
    • Hell, S.W.1    Wichmann, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.