SCOPUS 정보 검색 플랫폼

Cailiao Yanjiu Xuebao/Chinese Journal of Materials Research

Volumn 19, Issue 3, 2005, Pages 277-281

Growth of cubic MgxZr1-xO films and characterization

(4) Yu, Ping a Wu, Huizhen a,b Chen, Naibo a Xu, Tianning a

b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY (China)

Author keywords

Cubic MgxZn1 xO film; Inorganic non metallic materials; Low temperature physical deposition; MgxZn1 xO thin films; Refractive index

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DEPOSITION; MAGNESIUM COMPOUNDS; OXIDES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SILICA; SUBSTRATES; TRANSPARENCY; X RAY DIFFRACTION ANALYSIS;

CUBIC MGXZN1-XO FILM; INORGANIC NONMETALLIC MATERIALS; LOW TEMPERATURE PHYSICAL DEPOSITION; SILICON DIOXIDE SUBSTRATES;

FILM PREPARATION;

EID: 21844459202 PISSN: 10053093 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (2)

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