Scaling pFET hot-electron injection

2004 10th International Workshop on Computational Electronics, IEEE IWCE-10 2004, Abstracts

Volumn , Issue , 2004, Pages 149-150

  Duffy, Chris ^a   Hasler, Paul ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; GATES (TRANSISTOR); INTEGRAL EQUATIONS; IONIZATION; KINETIC ENERGY; MATHEMATICAL MODELS; PHONONS;

DISTRIBUTION FUNCTION; GATE OXIDE; HOT-ELECTRON INJECTION; OPTICAL PHONONS;

MOSFET DEVICES;

EID: 21844455312     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iwce.2004.1407370     Document Type: Conference Paper

References (5)

1. Chris Duffy and Paul Hasler, "Modeling Hot-Electron Injection in pFET's," Journal of Computational Electronics, Vol. 2, No. 2, December 2003, pp. 317-322.
2. E.M. Conwell, High Field Transport in Semiconductors, Academic Press, New York, 1967.
3. Paul Hasler, Andreas Andreou, Chris Diorio, Bradley A. Minch, and Carver Mead, "Impact ionization and hot-electron injection derived consistently from Boltzmann transport," VLSI Design, 8(14), 455(1998).
4. William Shockley, "Problems Related to p-n Junctions in Silicon," Solid-State Electronics, 1961, Vol. 2, No. 1, pp. 35-67.
5. J.D. Bude, B.E. Weir, P.J. Silverman, International Electron Devices Meeting '98 Technical Digest, December 1998, pp. 179-182.