Fluorescence correlation spectroscopy on dielectric surfaces in total internal reflection geometries

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 5699, Issue , 2005, Pages 159-166

  Anhut, Tiemo ^a   Hassler, Kai ^b   Lasser, Theo ^b   König, Karsten ^a   Rigler, Rudolf ^b  

^a FRAUNHOFER INSTITUTE FOR BIOMEDICAL ENGINEERING   (Germany)

^b EPFL   (Switzerland)

Author keywords

Fluorescence correlation spectroscopy; Total internal reflection

Indexed keywords

COMPUTATIONAL GEOMETRY; DIELECTRIC MATERIALS; OPTICAL MICROSCOPY; PHOTONS; REFLECTION; SENSITIVITY ANALYSIS; SPECTROSCOPY;

BIOMOLECULAR ANALYSIS; DIELECTRIC SURFACES; FLUORESCENCE CORRELATION SPECTROSCOPY; TOTAL INTERNAL REFLECTION;

FLUORESCENCE;

EID: 21844444535     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.591438     Document Type: Conference Paper

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