Analysis of strain fields by means of diffraction-line broadening

Materials Science Forum

Volumn 228-231, Issue PART 1, 1996, Pages 11-18

  Van Berkum, J G M ^a,b   Delhez, R ^a   De Keijser, Th H ^a   Mittemeijer, E J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Lattice Defects; Line Broadening; Modelling; Strain

Indexed keywords

COMPUTATIONAL METHODS; DISLOCATIONS (CRYSTALS); MATHEMATICAL MODELS; STRAIN;

DIFFRACTION LINE BROADENING; STRAIN FIELD MODEL;

X RAY CRYSTALLOGRAPHY;

EID: 0030386802     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.228-231.11     Document Type: Article

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