In situ layer-by-layer film formation kinetics under an applied voltage measured by optical waveguide lightmode spectroscopy

Langmuir

Volumn 21, Issue 13, 2005, Pages 5865-5871

  Ngankam, A Pascal ^a   Van Tassel, Paul R ^a  

^a Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LAYER-BY-LAYER (LBL) FILM FORMATION; OPTICAL WAVEGUIDE LIGHTMODE SPECTROSCOPY (OWLS); POLYELECTROLYTE SYSTEMS; YALE UNIVERSITY;

ADSORPTION; ELECTRIC POTENTIAL; ELECTROSTATICS; INDIUM COMPOUNDS; MULTILAYERS; OPTICAL WAVEGUIDES; OXIDATION; PLATINUM; POLYCYCLIC AROMATIC HYDROCARBONS; POLYELECTROLYTES; POLYSTYRENES; RATE CONSTANTS; SPECTROSCOPIC ANALYSIS; THICKNESS MEASUREMENT;

THIN FILMS;

EID: 21644465432     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la050066d     Document Type: Article

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