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Volumn 42, Issue SPL.ISS.1, 2004, Pages
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Modeling solid-state effects on NMR chemical shifts using electrostatic models
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Author keywords
Chemical shielding calculations; EIM; NMR; Point charge methods; SCREEP; Solid state effects
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Indexed keywords
CHEMICAL SHIFT;
ITERATIVE METHODS;
LIGHT POLARIZATION;
NEUTRON DIFFRACTION;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
SINGLE CRYSTALS;
CHEMICAL SHIELDING;
CHEMICAL SHIELDING CALCULATION;
EMBEDDED ION METHOD;
EMBEDDINGS;
POINT CHARGE;
POINT CHARGE METHOD;
SHIELDING CALCULATION;
SOLID-STATE EFFECT;
STATE EFFECTS;
SURFACE CHARGE REPRESENTATION OF THE ELECTROSTATIC EMBEDDING POTENTIAL;
ELECTROSTATICS;
CARBON;
NITROGEN;
ALGORITHM;
ARTICLE;
CHEMICAL MODEL;
ELECTROCHEMISTRY;
FACTUAL DATABASE;
HYDROGEN BOND;
NORMAL DISTRIBUTION;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
STATISTICS;
ALGORITHMS;
CARBON ISOTOPES;
DATABASES, FACTUAL;
ELECTROCHEMISTRY;
HYDROGEN BONDING;
MAGNETIC RESONANCE SPECTROSCOPY;
MODELS, CHEMICAL;
NITROGEN ISOTOPES;
NORMAL DISTRIBUTION;
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EID: 21644463235
PISSN: 07491581
EISSN: 1097458X
Source Type: Journal
DOI: 10.1002/mrc.1432 Document Type: Article |
Times cited : (20)
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References (53)
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