SCOPUS 정보 검색 플랫폼

Volumn 2, Issue 5, 2005, Pages 1489-1494

Semi-insulating CdTe with a minimum deep level doping

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEFECTS; DETECTORS; HEAT TREATMENT;

DEFECT REACTION; QUASICHEMICAL FORMALISM;

DOPING (ADDITIVES);

EID: 21644452077 PISSN: 16101634 EISSN: None Source Type: Conference Proceeding
DOI: 10.1002/pssc.200460830 Document Type: Article

Times cited : (5)

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