Molecular dynamics simulation of thermal conductivity of silicon films using environment-dependent interactomic potential

Proceedings of the ASME Heat Transfer/Fluids Engineering Summer Conference 2004, HT/FED 2004

Volumn 4, Issue , 2004, Pages 619-625

  Wang, Xinwei ^a   Lawrence, Cecil ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM THICKNESS; INTERATOMIC POTENTIAL; MOLECULAR DYNAMICS SIMULATION; SILICON FILMS;

ATOMIC PHYSICS; CRYSTAL LATTICES; MOLECULAR DYNAMICS; THERMAL CONDUCTIVITY; THICKNESS MEASUREMENT; THIN FILMS;

SILICON;

EID: 21544479123     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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