Terahertz and laser imaging for printed circuit board failure detection

AUTOTESTCON (Proceedings)

Volumn , Issue , 2004, Pages 563-569

  Keenan, Ernest ^a   Wright, R Glenn ^a   Mulligan, Robert ^a   Kirkland, Larry V ^b  

^a GMA Industries Inc   (United States)

^b Air Force Materiel Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL OVERSTRESS (EOS); ELECTRONIC TESTING; ELECTROSTATIC DISCHARGE (ESD); THERMAL SHOCK;

ADSORPTION; DIFFUSION; ELECTRIC DISCHARGES; ELECTROSTATICS; EQUIPMENT TESTING; IMAGING SYSTEMS; INTEGRATED CIRCUITS; LASER APPLICATIONS; MOISTURE;

PRINTED CIRCUIT BOARDS;

EID: 21544441789     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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3. W.M. Yee, M. Paniccia, T. Elles, V. Rao, "Laser Voltage Probe (LVP): A Novel Optical Probing Technology for Flip-Chip Packaged Microprocessors," in Proceedings of the 7th IPFA '99, Singapore, 1999.
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5. D. Chamberlin, "Emerging technologies in terahertz imaging", SURA Terahertz Symposium, Washington, DC, March 17, 2004.
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