Multi-level test generation and fault diagnosis for finite state machines

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 1150, Issue , 1996, Pages 264-281

  Ubar, R ^a   Brik, M ^a  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; LOGIC CIRCUITS;

ALTERNATIVE GRAPHS; DIFFERENT CLASS; FAULT PROPAGATION; FAULT SIMULATION; FUNCTIONAL LEVELS; HIGH-EFFICIENCY; STATE TRANSITION DIAGRAMS; TEST GENERATIONS;

FAULT DETECTION;

EID: 21444450790     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-61772-8_43     Document Type: Conference Paper

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