3D nano forces sensing for an AFM based nanomanipulator

Proceedings of the 2004 International Conference on Information Acquisition, ICIA 2004

Volumn , Issue , 2004, Pages 208-212

  Tian, Xiaojun ^a,b   Liu, Lianqing ^a,b   Jiao, Niandong ^a,b   Wang, Yuechao ^a   Dong, Zaili ^a   Xi, Ning ^a,c  

^a SHENYANG INSTITUTE OF AUTOMATION   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c Michigan State University   (United States)

Author keywords

3D Nano Forces modeling; AFM Based Nanomanipulator; Parameters Calibration

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; END EFFECTORS; PARAMETER ESTIMATION; PROBLEM SOLVING; REAL TIME SYSTEMS; SENSORY FEEDBACK; SILICON;

3D NANO FORCES MODELING; AFM BASED NANOMANIPULATORS; NANO MANIPULATION; PARAMETER CALIBRATION;

MANIPULATORS;

EID: 21444450648     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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