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Volumn 3204, Issue , 1997, Pages 68-73
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Full-field surface profiling using dynamic projected grids
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Author keywords
3 dimensional measurement; Automated inspection; Machine vision; Profilometry; Structured light; Surface profile
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Indexed keywords
3-DIMENSIONAL MEASUREMENT;
AUTOMATED INSPECTION;
MACHINE VISION;
STRUCTURED LIGHT;
SURFACE PROFILE;
BANDWIDTH;
COMPUTER VISION;
DIGITAL SIGNAL PROCESSING;
IMAGING SYSTEMS;
INSPECTION;
LEARNING ALGORITHMS;
LIGHT SOURCES;
LIGHTING;
OPTOELECTRONIC DEVICES;
PHOTODIODES;
PIXELS;
PROFILOMETRY;
ROTATION;
SENSORS;
SIGNAL ANALYSIS;
SIGNAL PROCESSING;
SURFACE MEASUREMENT;
THREE DIMENSIONAL;
TREES (MATHEMATICS);
LIGHT;
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EID: 2142711624
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.294442 Document Type: Conference Paper |
Times cited : (1)
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References (5)
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