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Journal of Materials Science

Volumn 39, Issue 8, 2004, Pages 2835-2839

Optical properties of SiO2-TiO2 sol-gel thin films

(4) Chrysicopoulou, P a Davazoglou, D b Trapalis, C c Kordas, G c

a HAROKOPIO UNIVERSITY (Greece)

b INSTITUTE OF MICROELECTRONICS (Greece)

c INSTITUTE OF MATERIALS SCIENCE (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS MATERIALS; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE REFLECTION; HYDROLYSIS; REFRACTIVE INDEX; REGRESSION ANALYSIS; SILICA; SOL-GELS; SPECTROPHOTOMETERS; SPECTRUM ANALYSIS; TITANIUM DIOXIDE;

ABSORPTION COEFFICIENTS; AMORPHOUS DIELECTRICS; FOROUHI-BLOOMER MODELS; OPTICAL DISPERSIONS;

THIN FILMS;

EID: 2142812969 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/B:JMSC.0000021461.07870.d0 Document Type: Article

Times cited : (14)

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