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Volumn 8, Issue 1-3, 1997, Pages 377-380

Effects of Thermal Treatment on the Structure and Properties of SiO2-TiO2 Gel Films on Silicon Substrates

Author keywords

FTIR; Sintering; Sol gel thin film

Indexed keywords

CHEMICAL BONDS; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HIGH TEMPERATURE EFFECTS; MOLECULAR STRUCTURE; REFRACTIVE INDEX; RESIDUAL STRESSES; SILICA GEL; SILICON; SINTERING; THIN FILMS; TITANIUM DIOXIDE;

EID: 0030678285     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02436868     Document Type: Article
Times cited : (32)

References (20)
  • 3
    • 0025568812 scopus 로고
    • edited by J.D. Mackenzie and D.R. Ulrich SPIE - The International Society for Optical Engineering, Bellingham
    • A.J. Martin and M. Green, in Sol-Gel Optics, edited by J.D. Mackenzie and D.R. Ulrich (SPIE - The International Society for Optical Engineering, Bellingham, 1990), p. 352.
    • (1990) Sol-Gel Optics , pp. 352
    • Martin, A.J.1    Green, M.2
  • 8
    • 0009181932 scopus 로고
    • edited by J.D. Mackenzie SPIE - The International Society for Optical Engineering, Bellingham
    • R.M. Almeida, H.C. Vasconcelos, and L.M. Ilharco, in Sol-Gel Optics III, edited by J.D. Mackenzie (SPIE - The International Society for Optical Engineering, Bellingham, 1994), p. 678.
    • (1994) Sol-Gel Optics III , pp. 678
    • Almeida, R.M.1    Vasconcelos, H.C.2    Ilharco, L.M.3
  • 18
    • 0014585991 scopus 로고
    • The Structure of Vitreous Silica
    • R.L. Mozzi and B.E. Warren, The Structure of Vitreous Silica, J. Appl. Cryst. 2, 164 (1969).
    • (1969) J. Appl. Cryst. , vol.2 , pp. 164
    • Mozzi, R.L.1    Warren, B.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.