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Volumn 16, Issue 14, 2004, Pages

Progress in quantitative elemental analyses in high P-T fluids using synchrotron x-ray fluorescence (SXRF)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CHEMICAL ANALYSIS; DEHYDRATION; DIFFRACTION; DISSOLUTION; ELECTRIC EXCITATION; FLUORESCENCE; FOCUSING; QUENCHING; RAYLEIGH SCATTERING; RUBIDIUM; SEISMOLOGY; SILICON; STRONTIUM; SYNCHROTRONS;

EID: 2142808251     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/14/031     Document Type: Conference Paper
Times cited : (10)

References (21)
  • 20
    • 0003459528 scopus 로고
    • ed R E Van Grieken and A A Markowicz (New York: Marcel) chapter
    • Helsen J A and Kuckzumow A 1993 X-Ray Spectrometry ed R E Van Grieken and A A Markowicz (New York: Marcel) chapter 2, p 127
    • (1993) X-ray Spectrometry , vol.2 , pp. 127
    • Helsen, J.A.1    Kuckzumow, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.