Measuring geometric phases of scattering states in nanoscale electronic devices

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 11, 2004, Pages

  Zhou, Huan Qiang ^a   Lundin, Urban ^a   Cho, Sam Young ^a   McKenzie, Ross H ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DEVICE; ELECTRIC POTENTIAL; ELECTRONICS; INTERFEROMETER; MEASUREMENT; NANOPARTICLE; OSCILLATION; QUANTUM MECHANICS;

EID: 2142751672     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.113308     Document Type: Article

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