메뉴 건너뛰기




Volumn 358, Issue 1-2, 1997, Pages 171-175

3D analysis of solids using sputtered MCs+ ions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 2142726853     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050375     Document Type: Article
Times cited : (3)

References (21)
  • 17
    • 0001990130 scopus 로고
    • Benninghoven A, Colton RJ, Simons DS, Werner HW (eds) Springer, Berlin Heidelberg New York
    • Migeon HN, Le Pipec C, Le Goux JJ (1986) In: Benninghoven A, Colton RJ, Simons DS, Werner HW (eds) Secondary ion mass spectrometry SIMS V. Springer, Berlin Heidelberg New York, p 155
    • (1986) Secondary Ion Mass Spectrometry SIMS V , pp. 155
    • Migeon, H.N.1    Le Pipec, C.2    Le Goux, J.J.3
  • 21
    • 0005507585 scopus 로고
    • Benninghoven A, Huber AM, Werner HW (eds) Wiley, Chichester
    • Wilson RG et al (1988) In: Benninghoven A, Huber AM, Werner HW (eds) Secondary ion mass spectrometry SIMS VI. Wiley, Chichester, p 133
    • (1988) Secondary Ion Mass Spectrometry SIMS VI , pp. 133
    • Wilson, R.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.