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Volumn 455-456, Issue , 2004, Pages 388-392

Analytical model for the optical functions of amorphous semiconductors and its applications for thin film solar cells

Author keywords

Amorphous semiconductors; Amorphous silicon (a Si:H) alloys; Amorphous silicon solar cells; Dielectric function parameterization; Tauc Lorentz formula

Indexed keywords

AMORPHOUS FILMS; ELLIPSOMETRY; ENERGY GAP; GERMANIUM; LIGHT REFLECTION; LIGHT TRANSMISSION; PHOTOCONDUCTING DEVICES; SEMICONDUCTING FILMS; SILICON; SOLAR CELLS; SPECTROSCOPIC ANALYSIS;

EID: 2142709482     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.234     Document Type: Conference Paper
Times cited : (42)

References (10)
  • 2
    • 25744460617 scopus 로고    scopus 로고
    • published as; see also these Proceedings)
    • R.W. Collins, D.E. Aspnes, E.A. Irene (Eds.), Spectroscopic Ellipsometry, Proceedings of the Second International Conference, Elsevier, Amsterdam, 1997 (published as Thin Solid Films 313-314 (1998); see also these Proceedings).
    • (1998) Thin Solid Films , vol.313-314
  • 6
    • 0021558454 scopus 로고
    • J.I. Pankove. Orlando, FL: Academic
    • Cody G.D. Pankove J.I. Semiconductors and Semimetals, vol. 21B. 1984;11 Academic, Orlando, FL.
    • (1984) Semiconductors and Semimetals , vol.21 B , pp. 11
    • Cody, G.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.