Surface reconstruction of α-(0001) sapphire: An AFM, XPS, AES and EELS investigation

Journal of Materials Science

Volumn 39, Issue 8, 2004, Pages 2911-2914

  Saw, K G ^a  

^a SCHOOL OF PHYSICS   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

ACETONE; ALUMINUM; ANNEALING; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; EPITAXIAL GROWTH; ETHANOL; FILM GROWTH; IMAGE ANALYSIS; METHANOL; SINGLE CRYSTALS; SURFACE CHEMISTRY; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

FULL WIDTH AT HALF MAXIMUM (FWHM); HYBRIDIZATION; SURFACE RECONSTRUCTION; VALENCE BAND (VB);

SAPPHIRE;

EID: 2142659361     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000021479.20164.f8     Document Type: Article

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