Applying wavelet-based hidden Markov tree to enhancing performance of process monitoring

Chemical Engineering Science

Volumn 60, Issue 18, 2005, Pages 5129-5143

  Chen, Junghui ^a   Chang, Wang Jung ^a  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

Hidden Markov model; Principal component analysis; Process monitoring; Statistical process control; Wavelet transform

Indexed keywords

ALGORITHMS; DATA REDUCTION; MARKOV PROCESSES; MEASUREMENT THEORY; NOISE ABATEMENT; SIGNAL DISTORTION; TREES (MATHEMATICS); WAVELET TRANSFORMS;

HIDDEN MARKOV TREE (HMT) MODELS; PROCESS MONITORING; STATISTICAL PROCESS MODEL (SPM);

STATISTICAL PROCESS CONTROL;

PROCESS CONTROL;

EID: 21344454882     PISSN: 00092509     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ces.2005.03.061     Document Type: Article

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