Footprints of deformation mechanisms during in situ x-ray diffraction: Nanocrystalline and ultrafine grained Ni

Applied Physics Letters

Volumn 86, Issue 23, 2005, Pages 1-3

  Budrovic, Z ^a   Van Petegem, S ^a   Derlet, P M ^a   Schmitt, B ^a   Van Swygenhoven, H ^a   Schafler, E ^b   Zehetbauer, M ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF VIENNA   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; DISLOCATIONS (CRYSTALS); ELECTRODEPOSITION; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; PLASTIC FLOW; SYNTHESIS (CHEMICAL); TORSIONAL STRESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DISLOCATION STRUCTURES; FULL WIDTH HALF MAXIMUM (FWHM); HIGH PRESSURE TORSION (HPT); PEAK BROADENING;

NICKEL;

EID: 21244504289     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1947385     Document Type: Article

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