Characterization of PZT thick films derived from sol-gel techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4086, Issue , 2000, Pages 617-620

  Cheng, Jinrong ^a   Luo, Laiqing ^a   Meng, Zhongyan ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

Internal Bias Field; Intrinsic piezoelectric responses; PZT thick films; Self poling; Sol gel

Indexed keywords

LEAD COMPOUNDS; PIEZOELECTRICITY; SOL-GEL PROCESS; SOL-GELS; THICK FILMS; THIN FILMS; TITANIUM COMPOUNDS; ZIRCONIUM COMPOUNDS;

INTERNAL BIAS FIELD; PIEZOELECTRIC RESPONSE; POLING EFFECT; PREFERRED ORIENTATIONS; PZT THICK FILMS; SELF POLING; SOL-GEL TECHNIQUE; THICK AND THIN FILMS;

FILM PREPARATION;

EID: 21244501685     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.408336     Document Type: Conference Paper

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