Principles of sequential-equivalence verification

IEEE Design and Test of Computers

Volumn 22, Issue 3, 2005, Pages 248-257

  Mneimneh, Maher N ^a   Sakallah, Karem A ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FINITE AUTOMATA; FLIP FLOP CIRCUITS; HEURISTIC METHODS; MATHEMATICAL MODELS; SEQUENTIAL MACHINES;

FINITE STATE MACHINES; SEQUENTIAL EQUIVALENCE VERIFICATION (SEV);

SEQUENTIAL CIRCUITS;

EID: 21244493661     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2005.68     Document Type: Article

References (13)

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