Sputter cleaning and annealing of zinc-blende MnTe surface - XPS study

Applied Surface Science

Volumn 249, Issue 1-4, 2005, Pages 222-230

  Iwanowski, R J ^a   Heinonen, M H ^b   Janik, E ^a  

^a INSTITUTE OF PHYSICS   (Poland)

^b UNIVERSITY OF TURKU   (Finland)

Author keywords

Ion bombardment; Manganese telluride; Single crystal surface; Univalent manganese; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; ION BOMBARDMENT; MANGANESE COMPOUNDS; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; SPUTTERING; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC;

MANGANESE TELLURIDE; SINGLE CRYSTAL SURFACE; SURFACE OXIDES; UNIVALENT MANGANESE;

SURFACE CLEANING;

EID: 21244481297     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.11.087     Document Type: Article

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