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Volumn 351, Issue 21-23, 2005, Pages 1764-1769

Electron spin resonance probing of fundamental point defects in nm-sized silica particles

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; HEAT TREATMENT; LIGHT ABSORPTION; PARAMAGNETIC RESONANCE; PARTICLE SIZE ANALYSIS; PHOTONS; POINT DEFECTS; SIGNAL PROCESSING; SILICA; STRUCTURE (COMPOSITION);

EID: 21244478290     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.04.011     Document Type: Conference Paper
Times cited : (9)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.