In situ transmission electron microscope observation of carbon nanotubes in electric fields

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 4 A, 2005, Pages 2051-2055

  Okai, Makoto ^a   Fujieda, Tadashi ^a   Hidaka, Kishio ^a   Muneyoshi, Takahiko ^a   Yaguchi, Tomio ^a  

^a HITACHI LTD   (Japan)

Author keywords

Carbon nanotube; Electric field; Emitter; Field emission display; Paste; Screen print; Transmission electron microscope

Indexed keywords

APPROXIMATION THEORY; CURRENT DENSITY; ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; ELECTRODES; ELECTRON EMISSION; FIELD EMISSION DISPLAYS; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

EMITTERS; FIELD-EMISSION DISPLAYS; SCREEN PRINT; TRANSMISSION ELECTRON MICROSCOPE;

CARBON NANOTUBES;

EID: 21244472694     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.2051     Document Type: Article

References (6)

1. See, for example, R. Saito, G. Dresselhaus and M. S. Dresselhaus: Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
2. Peter J. F. Harris: Carbon Nanotubes and Related Structures (Cambridge University Press, Cambridge, 1999).
3. L. Nilsson, O. Oroening, C. Emmenegger, O. Kuettel, E. Schaller and L. Schlapbach: Appl. Phys. Lett. 76 (2000) 2071.
4. K. B. K. Teo, M. Chhowalla, G. A. J. Amaratunga, W. I. Milne, G. Pirio, P. Legagneux, F. Wyczisk, D. Pribat and D. G. Hasko: Appl. Phys. Lett. 80 (2002) 2011.
5. T. J. Vink, M. Gillies, J. C. Kriege and H. W. J. J. van de Laar: Appl. Phys. Lett. 83 (2003) 3552.
6. K. Seko, J. Kinoshita, K. Kawakita and Y. Saito: Abstracts of the 26th Fullerene-Nanotubes General Symposium (Consumers' Cooperative Society of Nagoya University, Nagoya, 2004) p. 161.