X-ray photoelectron spectroscopy for detection of the different Si-O bonding states of silicon

Analytical and Bioanalytical Chemistry

Volumn 375, Issue 8, 2003, Pages 1276-1281

  Pleul, Dieter ^a   Frenzel, Ralf ^a   Eschner, Michael ^a   Simon, Frank ^a  

^a LEIBNIZ INSTITUTE OF POLYMER RESEARCH DRESDEN   (Germany)

Author keywords

Silane coupling agents; Silanization; Silica; X ray photoelectron spectroscopy (XPS)

Indexed keywords

BONDING; CHEMICAL BONDS; OXYGEN; SILANES; SILICA; STOICHIOMETRY; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

HETEROATOMS; SILANE COUPLING AGENTS; SILANIZATION; SILICA NETWORK;

SILICON;

EID: 21244436824     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-003-1811-7     Document Type: Conference Paper

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