Estimating nanoparticle size from diffraction measurements

Journal of Applied Crystallography

Volumn 33, Issue 6, 2000, Pages 1335-1341

  Hall, B D ^a   Zanchet, D ^b,c   Ugarte, D ^c  

^a CALLAGHAN INNOVATION   (New Zealand)

^b UNIVERSITY OF CAMPINAS   (Brazil)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; ATOMIC PARTICLE; CRYSTAL STRUCTURE; FOURIER ANALYSIS; MEASUREMENT; PARTICLE SIZE; RELIABILITY; X RAY DIFFRACTION;

EID: 0034481525     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800010888     Document Type: Article

References (12)

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