Application of exit-plane wave function images in high-resolution transmission electron microscopy for quantitative analysis of III-V semiconductor interfaces

International Journal of Nanoscience

Volumn 3, Issue 6, 2004, Pages 723-728

  Mahalingam, K ^a   Eyink, K G ^a   Brown, G J ^a   Dorsey, D L ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Exit plane wave function images; Factorial analysis of correspondence; High resolution transmission electron microscopy; III V semiconductor interfaces

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; COMPUTER SIMULATION; EIGENVALUES AND EIGENFUNCTIONS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; INTERFACES (MATERIALS); MATRIX ALGEBRA; TRANSMISSION ELECTRON MICROSCOPY;

EXIT-PLANE WAVE FUNCTION IMAGES (EPWF); FACTORIAL ANALYSIS OF CORRESPONDENCE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); III-V SEMICONDUCTOR INTERFACES;

SEMICONDUCTOR MATERIALS;

EID: 21144448051     PISSN: 0219581X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219581X04002668     Document Type: Article

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