Thermal characterization of GaAsN thin films by pulsed photothermal reflectance technique

International Journal of Nanoscience

Volumn 3, Issue 6, 2004, Pages 781-787

  Zhao, Yimin ^a   Chen, George ^a   Wang, Shanzhong ^a   Yoon, Soon Fatt ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

GaAsN epilayer; Pulsed photothermal reflectance; Thermal conductivity

Indexed keywords

EPILAYERS; GAASN EPILAYERS; PULSED PHOTOTHERMAL REFLECTANCE; THERMAL TRANSPORT;

HEAT CONDUCTION; MOLECULAR BEAM EPITAXY; SUBSTRATES; THERMAL CONDUCTIVITY; THERMAL EFFECTS; THERMODYNAMIC PROPERTIES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 21144447297     PISSN: 0219581X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219581X0400267X     Document Type: Article

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