Multi-scale statistical process monitoring in machining

IEEE Transactions on Industrial Electronics

Volumn 52, Issue 3, 2005, Pages 924-927

  Li, Xiaoli ^a   Yao, Xin ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Condition monitoring; Machining processes; Statistical process control (SPC); Wavelet transform (WT)

Indexed keywords

ACOUSTIC EMISSIONS; APPROXIMATION THEORY; CONDITION MONITORING; FRACTURE; MACHINING; TURNING; WAVELET TRANSFORMS;

DISCRETE WAVELET TRANSFORMS; FRACTURE DETECTION; STATISTICAL PROCESS MONITORING;

STATISTICAL PROCESS CONTROL;

EID: 21044431938     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2005.847580     Document Type: Article

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