Investigation of the spectra of phosphorescent organic light-emitting devices in relation to emission zone

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Wu, Zhaoxin ^a   Wang, Liduo ^a   Lei, Gangtie ^a   Qiu, Yong ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT LAYER (ETL); HOLE TRANSPORTING LAYER (HTL); ORGANIC LIGHT EMITTING DEVICES; WIDE ANGLE OPTICAL INTERFERENCE;

CATHODES; COMPUTER SIMULATION; ELECTROLUMINESCENCE; ELECTRON MOBILITY; HOLE MOBILITY; LIGHT INTERFERENCE; PHOSPHORESCENCE;

LIGHT EMITTING DIODES;

EID: 20944451794     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1900283     Document Type: Article

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21. Because the optical normal reflectivity of the interface between the ITO and glass layers is calculated to be about 1.4% (refractive indices of ITO and glass are 1.9 and 1.5 respectivelyd, when the reflective light beam from the interface between the ITO and glass layers is reflected by the metallic cathode again, it is too weak to interfere with another transmitted light beam. However, the normal reflectivity of a metallic cathode is about 86.1% (refractive index of Mg is 0.55+4.74i); so the effect of the wideangle interference is significant. FIG. 6. The calculated EL emission spectra of the blue PHOLED with various thicknesses of the Bphen integrated over the surface-escape cone. The solid, dashed, dotted, and dashed-dotted lines show the EL emission spectra with Bphen layers of 35-, 45-, 55-, and 65-nm thickness.