Magnetic properties and L1 0 phase formation of FePt films prepared by high current-density ion-beam irradiation and rapid thermal annealing methods

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Yokota, T ^a   Yan, M L ^a   Xu, Yingfan ^a   Gao, L ^a   Zhang, R ^a   Nicholl, L ^a   Yuan, L ^a   Skomski, R ^a   Sellmyer, D J ^a   Liou, S H ^a   Lai, Chih Huang ^b   Yang, Cheng Han ^b   Huang, Sheng Huang ^b  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS POWDERS; DEMAGNETIZATION CORRECTION; FERROMAGNETIC ELEMENTS; MILLING TIME;

AMORPHOUS MATERIALS; ANNEALING; COERCIVE FORCE; DEMAGNETIZATION; FERROMAGNETIC MATERIALS; GRINDING (MACHINING); MAGNETIC PROPERTIES; MAGNETIZATION; MILLING (MACHINING); POWDERS; REMANENCE; TERNARY SYSTEMS;

MAGNETS;

EID: 20944450932     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1853018     Document Type: Conference Paper

References (25)

1. E. S. Murdock, IEEE Trans. Magn. 28, 3078 (1992).
2. K. R. Coffey, M. A. Parker, and J. K. Howard, IEEE Trans. Magn. 31, 2737 (1995).
3. S. Sun, C. B. Murray, D. Weller, L. Folks, and A. Moser, Science 287, 1989 (2000).
4. A. S. Darling, Platinum Met. Rev. 7, 96 (1963).
5. D. J. Sellmyer, M. Yu, and R. Kirby, Nanostruct. Mater. 12, 1021 (1999).
6. T. Suzuki, H. Muraoka, Y. Nakamura, and K. Ouchi, IEEE Trans. Magn. 39, 691 (2002).
7. N. Honda, K. Ouchi, and S. Iwasaki, IEEE Trans. Magn. 38, 1615 (2002).
8. R. Woods, IEEE Trans. Magn. 36, 36 (2000).
9. T. Suzuki, N. Honda, and K. Ouchi, J. Magn. Soc. Jpn. 21, 177 (1997).
10. T. Maeda, T. Kai, A. Kikitsu, T. Nagase, and J. Akiyama, Appl. Phys. Lett. 80, 2147 (2002).
11. S. R. Lee, S. Yangt, Y. K. Kim, and J. G. Na, Appl. Phys. Lett. 78, 4001 (2001).
12. H. Kodama, S. Momose, N. Ihara, T. Uzumaki, and A. Tanaka, Appl. Phys. Lett. 83, 5253 (2003).
13. J. A. Christodoulides, M. J. Bonder, Y. Huang, Y. Zhang, S. Stoyanov, G. C. Hadjipanayis, A. Simopoulos, and D. Weller, Phys. Rev. B 68, 054428 (2003).
14. M. L. Yan, X. Z. Li, L. Gao, S. H. Liou, D. J. Sellmyer, R. J. M. van de Veerdonk, and K. W. Wierman, Appl. Phys. Lett. 83, 3332 (2003).
15. T. Yokota, L. Gao, S. H. Liou, M. L. Yan, and D. J. Sellmyer, J. Appl. Phys. 95, 7270 (2004).
16. D. Ravelosona, C. Chappwet, H. Bernas, D. Halley, Y. Samson, and A. Marty, J. Appl. Phys. 91, 8082 (2002).
17. T. Develder, Phys. Rev. B 62, 5794 (2000).
18. D. Ravelosona, C. Chappwet, V. Mathet, and H. Bernas, Appl. Phys. Lett. 76, 236 (2000).
19. B. D. Terris, L. Folks, D. Weller, J. E. Baglin, A. J. Kellock, H. Rothuizen, and P. Vettiger, Appl. Phys. Lett. 75, 403 (2002).
20. C. H. Lai, C. H. Yang, and C. C. Chiang, Appl. Phys. Lett. 83, 4550 (2002).
21. S. Okamoto, O. Kitakami, and Y. Shimada, J. Magn. Magn. Mater. 208, 102 (2000).
22. J.-U. Thiele, L. Folks, M. F. Toney, and D. K. Weller, J. Appl. Phys. 84, 5686 (1998).
23. B. E. Warren, X-ray Diffraction (Dover, New York, 1990), pp. 208-211.
24. O. Kitakami, H. Sato, Y. Shimada, F. Sato, and M. Tanaka, Phys. Rev. B 56, 13849 (1997).
25. C. Chen, O. Kitakami, S. Sato, and Y. Shimada, Appl. Phys. Lett. 76, 3218 (2000).